HUBEI AGRICULTURAL SCIENCES ›› 2019, Vol. 58 ›› Issue (16): 129-132.doi: 10.14088/j.cnki.issn0439-8114.2019.16.030

• Information Engineering • Previous Articles     Next Articles

Measurement of wheat leaf area based on computer vision

HAO Ya-jie, ZHANG Wu-ping, SHI Wei-jie, ZHAO Ming-xia, LYU Zhi, LI Fu-zhong   

  1. College of Software,Shanxi Agricultural University,Taigu 030801,Shanxi,China
  • Received:2019-06-03 Online:2019-08-25 Published:2019-11-12

Abstract: The computer vision technology was used to identify the lateral and overhead images of the target crop wheat, and the corresponding leaf area was calculated. The multi-variable factors were used to measure and analyze it. Finally, the real area of the leaf was compared and analyzed to establish a relationship model. The results showed that there was a regression relationship between the lateral beat, the overshoot area and the true leaf area of the wheat plants, the correlation was high, and the R2 value reached 0.91. After verification, the measurement results are more accurate, indicating that this regression model is feasible.

Key words: computer vision, wheat, leaf area, number of pixels

CLC Number: